Sieve Analysis of up to 15 kg Sample Weight
HAVER EML 450 digital plus for dry and wet sieving
The HAVER EML 450 digital plus for test sieves with diameters of up to 450 mm can be used for dry and wet sieving of 15 kg bulk material maximum. It is the largest electromagnetically driven 3D Test Sieve Shaker of HAVER & BOECKER. You can set and store sieving time, interval and amplitude for reproducible sieving results.
Controlled sieving action
- The 3D sieving action saves time and manual re-sieving.
- Self-readjusting amplitude for comparable sieving results.
Further advantages at a glance
- Memory of 99 sieving programs.
- Low-noise and maintenance free.
- Test sieves can be changed easily by using the quick-release clamping system TwinNut.
Technical data
| Sieve diameters | 200 mm*, 203 mm (8")*, 300 mm, 305 mm (12"), 315 mm, 350 mm, 400 mm, 450 mm |
|---|---|
| Sample weight | approx. 15 kg |
| Weight of sieve set | max. 42 kg |
| Operating voltage | 230 Volt oder 110 Volt with transformer, 50-60 Hertz |
| Amplitude | constant, self-readjusting amplitude up to maximal 2 mm |
| Timer | 0-99 minutes or permanent operating |
| Power consumption | ca. 1200 VA with full charge |
| Sound emission | 73 dBA |
| Weight | approx. 135 kg (without test sieves) |
| Dimensions | 585 x 575 x 1300 mm (D x W x H) |
* Adapter is required
HAVER EML 450 digital plus - application examples
Suitable test sieves for your application
It depends on your application which test sieves should be used for sieve analysis with the HAVER EML 450 digital plus. It is suitable for up to 12 test sieves and one sieve pan with a diameter of 400 mm.
We offer test sieves from 20 micron up to 125 mm according to your requirements or you can take a standard sieve set with following specifications:
Dimensions: | St. st. Test Sieves 400 x 65 mm according to DIN ISO 3310-1 / ASTM |
|---|---|
Openings: | 45 µm, 63 µm, 125 µm, 250 µm, 500 µm, 1 mm, 2 mm, 4 mm, sieve pan |
E-Shop Particle Analysis
With this E-Shop button the required test sieve shaker can be specified directly.








